Radiation effects in semiconductor devices have come to play a major role in the performance and reliability of today’s electronics. Several reliability questions also arise from new applications (such as self-driving cars, nanosatellites, medical implants etc.). As the demand for radiation hardness testing is on the rise, the availability of radiation facilities providing industrial access to perform these tests seems to be decreasing. Traditional testing methodologies also seem to be limited in face of new semiconductor technologies.

The G-RAD workshop aims to put together testing facilities and radiation experts and stakeholders from industry and academia to stimulate discussion on current and future needs in radiation hardness testing and evaluate limitations of available radiation facilities and possible evolutions.

This short 2 day workshop will take place on December 9th and 10th 2020, in Grenoble, France. Virtual participation is encouraged but presence onsite for participants who are able to travel will also be available.